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Smart Card Analyser


MP-300 TC3

Smart cards tester featuring :
Numerous adjustable parameters
Perfect repeatability of test scenarios
Trace visualisation
Advanced measurements capabilities
Injection of perturbations in the dialog

The MP300 is an innovating concept of modular architecture. It is based on a powerful mother board and some dedicated modules for contact and contactless smart cards.

The MP300 TC3 is a highly customizable tester for smart cards. The MP300 TC3 enables the testing and the validation of smart cards, masks and applications at margin conditions.
The software provided will give you at a glance all the informations about your chips. Experts and non-experts can easily control the specifications of the chip through the different graphs.

Perturbations generation
Perturbations can be performed to check the behavior of the card against unaccustomed conditions such as:
· Forced parity errors in emission and reception
· Glitch generations on Vcc and Clock
· Modification of timings (for example TA, TB, TCTH for ISO 7816-3)
· ETU width adjustable
· Protocol level perturbations

Measurements
Static and dynamic measurements are available on any contact. Repeatability is ensured by a temperature sensor.
Parametric tests and other U/I measurements are used for the checking of the internal connections and behaviors of the chips to deal with the quality issues.

Open Platform
All the Micropross products are based on APIs and allows all customers to develop their own applications. Usual programming languages are supported.
High speed and easy communications are guaranteed by Ethernet and USB connections.

Support
As with any Micropross product, our hot line and free software update are included during 12 months.

MP300 TC3

Open/short test

Available contacts

    Contact C1, C2, C3, C4, C5, C6, C7, C8

Forced current

    Adjustable between –500µA and 500µA

Leakage current measurement

Available contacts

    Contact C1, C2, C3, C4, C6, C7, C8

Measurement ranges

         +/- 5mA

         + - 500µA

Voltage measurement

Available contacts

     Contacts C1, C2, C3, C4, C6, C7, C8

Range available

         +/- 10V

Modes available

     Dynamic mode : we give you an analog like vision of the voltage on the pin you chose from the moment you chose

     Static mode : we give you the instant voltage value

       Burst mode : 512000 voltage measurements are made with 40ns in between, on C1 and C6, to give an analog like display of the studied signal

Current measurement

Available contacts

         Contacts C1, C2, C3, C4, C6, C7, C8

Ranges available

         +/- 100mA

         +/- 25mA

         +/- 5mA

         +/- 500µA

Modes available

    Dynamic mode : we give you an analog like vision of the current on the pin you chose from the moment you chose

     Static mode : we give you the instant current value on the selected contact

     Burst mode : 512000 current measurements are made with 40ns in between, on C1 and C6, to give an analog like display of the studied signal

Parametric tests

Available contacts

         Contacts C1, C2, C3, C4, C6, C7, C8

Modes available

         Force a current, measure a voltage

         Force a voltage, measure a current

 



  MP-300 TC3

Smart Card Analyser

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